| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10640077 | Materials Science and Engineering: B | 2005 | 6 Pages |
Abstract
Surface analysis was performed on the glass surface. As a result of XPS analysis on the glass surface, the amount of carbon compound observed was a function of baking temperature. SIMS showed that the amount of adsorbed carbon in the SnO2:F film was reduced with the increasing baking temperature, and with UV irradiation. For samples baked at 400 °C in vacuum, the carbon adsorption in SnO2:F film does not show significant difference between before and after UV irradiation.
Related Topics
Physical Sciences and Engineering
Materials Science
Electronic, Optical and Magnetic Materials
Authors
Tetsuo Minaai, Mika Kumagai, Atsushi Nara, Sakae Tanemura,