| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10640091 | Materials Science and Engineering: B | 2005 | 5 Pages |
Abstract
The microstructure, domain morphology, and piezoelectric properties of Si-doped PMS-PZT ceramics were investigated. TEM results revealed that the domain morphology evolved from the normal herringbone to the micron-sized lenticular shape and to the final “wavy” pattern when SiO2 content varied from 0 to 1Â wt.%. Nano-scaled secondary phases consisting of SiO2 and PbSiO3 were observed on the grain boundary and twinned ZrO2 was observed around the PMS-PZT perovskite phase. The mechanism for the formation of the twinned ZrO2 and the dependence of its content on SiO2 concentration were studied. The deterioration of the piezoelectric properties was also discussed.
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Authors
Z.G. Zhu, G.R. Li, L.Y. Zheng, Q.R. Yin,