Article ID Journal Published Year Pages File Type
10643587 Superlattices and Microstructures 2005 7 Pages PDF
Abstract
We present a simple method for the characterization of the dynamical behavior of the SThM Wollaston wire thermal resistive probe using Si/SiGe microcoolers. Measurements show a time response of about 186 μs. This value confirms the value found in the literature. Measurements also allow us to determine the total thermal tip-sample contact resistance ZThC.
Keywords
Related Topics
Physical Sciences and Engineering Materials Science Electronic, Optical and Magnetic Materials
Preview
Dynamical behavior of the scanning thermal microscope (SThM) thermal resistive probe studied using Si/SiGe microcoolers
Authors
, , , , , , ,