Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10653137 | Solid State Communications | 2005 | 5 Pages |
Abstract
Ge nanocrystals (NCs) embedded in SiO2 are synthesized by ion implantation, and the surface vibrational modes of the Ge NCs are investigated using the low-frequency Raman scattering (LFRS) technique. LFRS studies show distinct low-frequency Raman modes in the range 6.5-21.2Â cmâ1 for the Ge NCs depending on the implant dose and annealing temperature. These low-frequency Raman modes are attributed to the confined surface acoustic phonon modes of Ge NCs with (0,0) spheroidal mode and (0,3) torsional modes. Our results are in excellent agreement with the recent theoretical predictions of surface vibrational modes in Ge NCs.
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Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
P.K. Giri, R. Kesavamoorthy, B.K. Panigrahi, K.G.M. Nair,