Article ID Journal Published Year Pages File Type
10653450 Solid State Communications 2005 4 Pages PDF
Abstract
Nickel-doped ZnO (Zn1−xNixO) have been produced using rf magnetron sputtering. X-ray diffraction measurements revealed that nickel atoms were successfully incorporated into ZnO host matrix without forming any detectable secondary phase. Ni 2p core-level photoemission spectroscopy confirmed this result and suggested Ni has a chemical valence of 2+. According to the magnetization measurements, no ferromagnetic but paramagnetic behavior was found for Zn0.86Ni0.14O. We studied the electronic structure of Zn0.86Ni0.14O by valence-band photoemission spectroscopy. The spectra demonstrate a structure at ∼2 eV below the Fermi energy EF, which is of Ni 3d origin. No emission was found at EF, suggesting the insulating nature of the film.
Related Topics
Physical Sciences and Engineering Materials Science Materials Science (General)
Authors
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