Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10653450 | Solid State Communications | 2005 | 4 Pages |
Abstract
Nickel-doped ZnO (Zn1âxNixO) have been produced using rf magnetron sputtering. X-ray diffraction measurements revealed that nickel atoms were successfully incorporated into ZnO host matrix without forming any detectable secondary phase. Ni 2p core-level photoemission spectroscopy confirmed this result and suggested Ni has a chemical valence of 2+. According to the magnetization measurements, no ferromagnetic but paramagnetic behavior was found for Zn0.86Ni0.14O. We studied the electronic structure of Zn0.86Ni0.14O by valence-band photoemission spectroscopy. The spectra demonstrate a structure at â¼2Â eV below the Fermi energy EF, which is of Ni 3d origin. No emission was found at EF, suggesting the insulating nature of the film.
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Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
Zhigang Yin, Nuofu Chen, Fei Yang, Shulin Song, Chunlin Chai, Jun Zhong, Haijie Qian, Kurash Ibrahim,