| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10653715 | Solid State Communications | 2005 | 5 Pages |
Abstract
Structural and electronic characterisation of mechanically polished (010) KGd(WO4)2 (KGW) has been produced by reflection high-energy electron diffraction (RHEED) and X-ray photoelectron spectroscopy (XPS). With XPS analysis the original element binding energies, chemical composition and valence band structure of KGW have been determined.
Related Topics
Physical Sciences and Engineering
Materials Science
Materials Science (General)
Authors
V.V. Atuchin, V.G. Kesler, N.Yu. Maklakova, L.D. Pokrovsky,