Article ID Journal Published Year Pages File Type
10654165 Solid State Communications 2005 6 Pages PDF
Abstract
The damage morphologies, threshold fluences in ZnO films were studied with femtosecond laser pulses. Time-resolved reflectivity and transmissivity have been measured by the pump-probe technique at different pump fluences and wavelengths. The results indicate that two-phase transition is the dominant damage mechanism, which is similar to that in narrow band gap semiconductors. The estimated energy loss rate of conduction electrons is 1.5 eV/ps.
Related Topics
Physical Sciences and Engineering Materials Science Materials Science (General)
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