Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10666338 | Materials Letters | 2005 | 5 Pages |
Abstract
Nanoscopic characterization of the local ferroelectricity by piezoresponse measurements with scanning probe microscope is performed on a 40 nm-thick (Pb,La)(Zr,Ti)O3 (PLZT) (8/65/35) thin film prepared on a Nb-SrTiO(001) substrate. The microscopic piezoresponse showed a nearly linear dependence on the DC bias voltage with a slight bistability. The poled structure showed rapid retention. We attribute the bistability observed in the piezoresponse and the vanishing of the poled structure to a phase transition between the relaxor phase and the field-induced ferroelectric phase. The control and imaging of the local domain structure are also performed.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Takashi Tokuda, Takashi Nakano, Daisuke Fujiu, Jun Ohta, Masahiro Nunoshita,