Article ID Journal Published Year Pages File Type
10668320 Surface and Coatings Technology 2011 5 Pages PDF
Abstract
► Quantitatively analyzing the data of AFM images. ► Obtain the values and the evolutions of the growth front parameters. ► The relationship of resistivity with film thickness and roughness evolution is discussed. ► The dependence of optical properties on thickness and roughness is investigated.
Keywords
Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
Preview
Electrical and optical properties dependence on evolution of roughness and thickness of Ga:ZnO films on rough quartz substrates
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