Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10668457 | Surface and Coatings Technology | 2011 | 4 Pages |
Abstract
Composite tin/n-hexane plasma polymer films were prepared by means of RF magnetron sputtering of tin target in Ar:n-hexane mixture and characterised by various analytical techniques. Their chemical composition was examined by XPS, current-voltage characteristics were measured, and their structure was investigated by conventional TEM and electron tomography. The acquired three-dimensional reconstructions were morphologically analysed by a self-made computer analytical tool, which estimated the mean form factor and the average effective radius of the reconstructed metal inclusions.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Jindrich Matousek, Rudolf Hrach, Martin Svec, Jaroslav Pavlik, Stanislav Novak, Lubomir Kovacik,