| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10669623 | Thin Solid Films | 2015 | 5 Pages |
Abstract
The exchange bias effect was studied on antiferromagnetic-ferromagnetic UO2/permalloy (Ni80Fe20) thin films. Films with a fixed thickness of UO2 layer and variable thickness of the covering Ni80Fe20 layer have been grown by reactive sputter deposition. The X-ray diffraction study showed epitaxial growth of the UO2 layer on (100) CaF2 substrates and a polycrystalline permalloy layer on top of it. The samples exhibited perpendicular exchange bias with the maximum magnitude of 22Â mT found in UO2/Ni80Fe20 with the thinnest permalloy of 177Â Ã
.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
E.A. Tereshina, S. Daniš, R. Springell, Z. Bao, L. Havela, R. Caciuffo,