| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10669672 | Thin Solid Films | 2014 | 4 Pages |
Abstract
Exciton resonances are observed in the dielectric functions of wurtzite AlN by spectroscopic ellipsometry for the electric field vector parallel and perpendicular to the optical axis. The temperature dependence of these excitons is analyzed in detail. From the dielectric functions, reflectivity spectra are calculated and compared to experimentally obtained reflectivity, perfect agreement is found. The relative oscillator strengths of excitons showing different symmetries are discussed yielding an unambiguous assignment of free excitons formed by holes from the highest valence band. As a consequence, a negative exciton spin-exchange coupling constant of j = â 4 meV is derived.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Martin Feneberg, MarÃa Fátima Romero, Benjamin Neuschl, Klaus Thonke, Marcus Röppischer, Christoph Cobet, Norbert Esser, Matthias Bickermann, Rüdiger Goldhahn,