| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10669686 | Thin Solid Films | 2014 | 4 Pages |
Abstract
Epitaxial (Ba0.39Sr0.61)6Ti2Nb8O30 (BSTN) thin films have been prepared on MgO (001) substrates by pulsed laser deposition technique. Their structural qualities and surface morphology were studied by X-ray diffraction (XRD) and scanning electron microscopy. XRD indicates that single crystalline BSTN layers with (001) orientation perpendicular to the substrate plane were obtained. Optical studies by ellipsometric and optical transmittance spectra measurements were carried out. The optical constants (refractive index n and extinction coefficient k) of the BSTN film have been determined.
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Authors
Y.L. Zhang, S.H. Yang, D.D. Teng,