Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10669715 | Thin Solid Films | 2014 | 6 Pages |
Abstract
The effective complex dielectric function (ε) of Cu and O containing CdTe thin films is reported in the spectral range of 0.05 to 6 eV. The films were fabricated by rf sputtering from targets comprised by a mixture of CdTe and CuO powders with nominal Cu and O concentrations in the range of 2-10 at.%. Low concentration levels improved the crystalline quality of the films. Spectroscopic ellipsometry and transmittance measurements were used to determine ε. The critical point energies E1, E1 + Î1, and E2 of CdTe are red-shifted with the incorporation of Cu and O. Also, an absorption band is developed in the infrared range which is associated with a mixture of CdTe and low resistivity phases Cu2 â xTe according to an effective medium analysis. The elemental distribution of the films was mapped by energy dispersive X-ray spectroscopy using scanning transmission electron microscopy.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
A. Mendoza-Galván, G. Arreola-Jardón, L.H. Karlsson, P.O.Ã
. Persson, S. Jiménez-Sandoval,