Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10669740 | Thin Solid Films | 2014 | 4 Pages |
Abstract
Diffractive optics for hard X-rays feature superior properties in terms of resolution and efficiency, if volume diffraction effects are exploited all-over the aperture. For multilayer Laue lenses, preferably a wedged geometry is required to obtain this effect. We present an approach utilizing an additional stress layer to realize the necessary geometrical modifications where each lens can be customized to a selected photon energy independently of the given multilayer deposition. The quality of the deposition of the stress layer is evaluated using a laboratory X-ray microscope prior to its application at synchrotron radiation facilities with a special approach to measure the relative layer tilt at high spatial resolution.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Sven Niese, Peter Krüger, Adam Kubec, Roman Laas, Peter Gawlitza, Kathleen Melzer, Stefan Braun, Ehrenfried Zschech,