| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10669847 | Thin Solid Films | 2012 | 7 Pages |
Abstract
⺠Interfacial instability phenomena of SnO2/Ag/SnO2 trilayers were observed. ⺠At 200 °C, internal hillock, whiskers and islands of Ag were produced. ⺠Thermal stresses are not high enough to lead to the observed defect densities. ⺠Dewetting of internal Ag interfaces must be driving whisker and island formation.
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Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Suk Jun Kim, Eric A. Stach, Carol A. Handwerker,