Article ID Journal Published Year Pages File Type
10669878 Thin Solid Films 2012 5 Pages PDF
Abstract
► Bi1.5Zn1.0Nb1.5O7 BZN thin films were deposited on polycrystalline alumina substrates. ► Dielectric properties were evaluated by split-post dielectric resonator method. ► BZN films exhibit excellent dielectric properties in the microwave frequency range. ► The dielectric constant of crystallized BZN films is 154 at 10 GHz
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Physical Sciences and Engineering Materials Science Nanotechnology
Preview
Structure and microwave dielectric properties of Bi1.5Zn1.0Nb1.5O7 thin films deposited on alumina substrates by pulsed laser deposition
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