| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10669926 | Thin Solid Films | 2012 | 5 Pages |
Abstract
⺠Characterization of Si wafer passivated with hydrogenated amorphous silicon films. ⺠Determination of free carrier transport parameters by PhotoCarrier Radiomentry (PCR). ⺠Detailed comparisons of PCR-derived lifetime values with conventional techniques. ⺠PCR method may be used for optoelectronic quality control of the α-Si/c-Si interface.
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Authors
A. Melnikov, B. Halliop, A. Mandelis, N.P. Kherani,