| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10670104 | Thin Solid Films | 2012 | 5 Pages |
Abstract
⺠Device-quality CIGS thin films are prepared by a three-stage evaporation process. ⺠The surface layer shows a gradually Cu-poor compositional distribution. ⺠The thickness of the surface layer is in the range of 50-100 nm. ⺠The surface and the bulk of the material exhibit similar crystal structure. ⺠The surface layer contains a large amount of dislocations.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Zhang Li, Xue Yu-Ming, Xu Chuan-Ming, He Qing, Liu Fang Fang, Li Chang-Jian, Sun Yun,