Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10670112 | Thin Solid Films | 2012 | 7 Pages |
Abstract
⺠Filtered Cathodic Vacuum Arc deposited ultra-thin ta-C films (1-10 nm thick). ⺠CK-edge NEXAFS provides evidence of surface defects (CâH bonds). ⺠Concentration of CâH surface defects decreases with increasing thickness. ⺠Ï*CC behavior suggestive of rise and fall of sp2 bonding configuration. ⺠Critical thickness required for stability of sp3 distorted sp2 structures.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Navneet Soin, Susanta Sinha Roy, Sekhar Chandra Ray, Patrick Lemoine, Md. Anisur Rahman, Paul D. Maguire, Sushanta K. Mitra, James A. McLaughlin,