| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10670251 | Thin Solid Films | 2012 | 6 Pages |
Abstract
âºHigh energy ellipsometry measurement on three phases of Ge-Sb-Te films. ⺠The 1.5 eV peak intensity is not conserved during the amorphous-FCC transition. âºHigh temperature real time detection on spectral change during transitions. âºResults consistent with previous theoretical studies.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Y.K. Seo, J.-S. Chung, Y.S. Lee, E.J. Choi, B. Cheong,