| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10670321 | Thin Solid Films | 2012 | 6 Pages |
Abstract
⺠Amorphous carbon layers of different thickness are inserted in Fe3O4/n-Si junctions. ⺠The current transport in thinner junctions is dominated by thermionic field emission. ⺠Tunneling is the dominant mechanism for the thicker junctions. ⺠Room-temperature PMR can be enhanced by increasing a-C layer thickness.
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Authors
Z.W. Fan, P. Li, L.T. Zhang, W.B. Mi, E.Y. Jiang, H.L. Bai,