Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10670376 | Thin Solid Films | 2011 | 4 Pages |
Abstract
Suitable combinations of the optical response and geometrical form of flat or curved interfaces of the constituents in nanometer-sized metamaterials can lead to a strong enhancement of local fields, seen typically as sharp spectral resonances in optical spectra. We propose a classification of the resonant phenomena in inhomogeneous systems within the effective-medium approximation, and examine their manifestation in infrared ellipsometry. We report mid-infrared ellipsometric spectra of a doped semiconductor metamaterial, exhibiting negative refraction. We provide a simple explanation for the difference in the directions of the phase- and energy propagation. The resonance responsible for a strong anisotropy and the interesting behavior of refracted light is found to lead to characteristic features in the ellipsometric spectra.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
J. HumlÃÄek,