| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10670411 | Thin Solid Films | 2011 | 7 Pages |
Abstract
The method can be used for mapping and quality control in the case of large area solar cell table production lines even in a vacuum chamber with 5-10Â mm lateral resolution.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
M. Fried, G. Juhász, C. Major, P. Petrik, O. Polgár, Z. Horváth, A. Nutsch,