| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10670457 | Thin Solid Films | 2011 | 4 Pages |
Abstract
The optical properties of ZnTe and ZnS nanocrystals (ZnTe-NC and ZnS-NC) were determined by Spectroscopic Ellipsometry. The nanocrystals were embedded in a SiO2 matrix by ion implantation technique. Their sizes were characterized by transmission electron microscopy. The ZnTe-NC and ZnS-NC were modelled using Critical Points (CPs) dispersion formulas developed by Adachi. Besides the CPs model, the Tauc-Lorentz model was found to be another choice to get a good spectral fitting. Here we demonstrated that these models yield reasonable values of optical constants of II-VI nanocrystals. The best agreement was found with the experimental data over the entire range of 0.6 to 6.5Â eV.
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Authors
A. En Naciri, F. Ahmed, M. Stchakovsky,