Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10670498 | Thin Solid Films | 2011 | 5 Pages |
Abstract
Optical switching processes of Mg-Ni based switchable mirrors were studied “in situ” using spectroscopic ellipsometry. Ellipsometric angles Ψ and Î of the switchable mirrors varied drastically as a result of hydrogenation and dehydrogenation. These variations are due to transformation between metal and semiconductor of Mg-Ni layers. We have clarified the switching processes by analyzing these variations using the following two steps. First, we evaluated dielectric functions of five materials: metal, hydrogen-solid-solution, hydride states of Mg-Ni alloy, and metal and hydride states of Pd. Using these dielectric functions, we then varied thickness and concentration of each layer.
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Authors
Y. Yamada, K. Tajima, M. Okada, M. Tazawa, A. Roos, K. Yoshimura,