| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10670651 | Thin Solid Films | 2005 | 5 Pages |
Abstract
Ellipsometric and spectroscopic investigations of Hf1âxZrxO2 thin films were performed. Dispersion dependences of refractive indices and extinction coefficients in the wavelength interval 0.2-0.7 μm were obtained by optical-refractometric synthesis of absorption spectra. Optical-refractometric relation is applied to describe the dispersion of the refractive indices. Compositional behaviour of optical pseudogap and refractive indices of HfO2-ZrO2 thin films is studied.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
I.P. Studenyak, M. KranjÄec, O.T. Nahusko, O.M. Borets,