| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10670785 | Thin Solid Films | 2005 | 6 Pages |
Abstract
We have developed a wedge-loaded double-cantilever beam adhesion measurement set-up for thin films deposited on glass by sputtering. The test is described in details. Results on the Glass/sublayer/Ag/ZnO multilayer provide evidence that SnO2 or TiO2 perform better than ZnO as a sublayer. Then however, rupture within the multilayer shifts to the upper Ag/ZnO interface. The latter is shown to be tougher than the lower ZnO/Ag interface, an asymmetry due to non-equilibrium interfacial structures.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
E. Barthel, O. Kerjan, P. Nael, N. Nadaud,