Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10671006 | Thin Solid Films | 2005 | 7 Pages |
Abstract
We investigated the growth characteristics of the nanocrystalline diamond films using CCl4/H2 as gas sources in a hot-filament chemical vapor deposition (CVD) reactor. Successful growth of nanocrystalline diamond at typical growth condition of 1.5-2.5% CCl4 and 550-730 °C substrate temperature has been demonstrated. Glancing angle X-ray diffraction (XRD) clearly indicated the formation of diamond in the films. Typical root-mean-square surface roughness of 10-15 nm and an optimal root-mean-square surface roughness of 6 nm have been achieved. Transmission electron microscopy (TEM) analyses indicated that nanocrystalline diamond film with an average grain size in the range of 10-20 nm was deposited from 2.5% CCl4/H2 at 610 °C. Effects of different source gas composition and substrate temperature on the grain nucleation and grain growth processes, whereby the grain size of the nanocrystalline film could be controlled, were discussed.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Jih-Jen Wu, Chen-Hao Ku, Te-Chi Wong, Chien-Ting Wu, Kuei-Hsien Chen, Li-Chyong Chen,