Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10672448 | Ultramicroscopy | 2015 | 15 Pages |
Abstract
Improving both the precision and the accuracy of Atom Probe Tomography reconstruction requires a correct understanding of the imaging process. In this aim, numerical modeling approaches have been developed for 15 years. The injected ingredients of these modeling tools are related to the basic physic of the field evaporation mechanism. The interplay between the sample nature and structure of the analyzed sample and the reconstructed image artefacts have pushed to gradually improve and make the model more and more sophisticated. This paper reviews the evolution of the modeling approach in Atom Probe Tomography and presents some future potential directions in order to improve the method.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
F. Vurpillot, C. Oberdorfer,