Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10672468 | Ultramicroscopy | 2015 | 6 Pages |
Abstract
Artefacts in atom probe tomography can impact the compositional analysis of microstructure in atom probe studies. To determine the integrity of information obtained, it is essential to understand how the positioning of features influences compositional analysis. By investigating the influence of feature orientation within atom probe data on measured composition in microstructural features within an AA2198 Al alloy, this study shows differences in the composition of T1 (Al2CuLi) plates that indicates imperfections in atom probe reconstructions. The data fits a model of an exponentially-modified Gaussian that scales with the difference in evaporation field between solutes and matrix. This information provides a guide for obtaining the most accurate information possible.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Maria A. Mullin, Vicente J. Araullo-Peters, Baptiste Gault, Julie M. Cairney,