| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10672522 | Ultramicroscopy | 2009 | 5 Pages |
Abstract
This work describes an approach to interpret the near-edge fine structure of electron energy-loss spectroscopy (EELS) of O K-edge in zircon using a structural variation method. The positions and intensities of several peaks in the O K-edge EELS spectrum are assigned to specific structural parameters. It suggests that the near-edge structures in EELS can be used to measure atomic structure changes.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Nan Jiang, John C.H. Spence,