| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10672525 | Ultramicroscopy | 2011 | 4 Pages |
Abstract
⺠Experimental data of the beam divergence of an indium LMIS. ⺠Derived beam divergence close to needle tip from experimental data. ⺠Provision of initial conditions for ion trajectory simulations. ⺠Empiric formula for beam div. close to needle tip as function of emission current. ⺠Result is of special interest for applications without beam-limiting aperture.
Keywords
Related Topics
Physical Sciences and Engineering
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Nanotechnology
Authors
I. Vasiljevich, M. Tajmar,