| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10672531 | Ultramicroscopy | 2011 | 11 Pages |
Abstract
⺠Quantitative analysis of the composition by low-voltage STEM annular dark field. ⺠First evidence of channelling effects in low-voltage STEM in SEM. ⺠Comparison between low-voltage and high-voltage STEM. ⺠Evaluation of the absorption effects on the STEM intensity.
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Authors
L. Felisari, V. Grillo, F. Jabeen, S. Rubini, C. Menozzi, F. Rossi, F. Martelli,