| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10672532 | Ultramicroscopy | 2011 | 8 Pages |
Abstract
⺠Different CTF models for tilted and thick specimens are related. ⺠Computation time for tilted CTF reduced more than 100 à by new algorithm. ⺠Loss of resolution due to specimen thickness predicted by analytic expression. ⺠Effect of specimen thickness on resolution is quantified using simulations. ⺠New approach for space-variant phase-flipping which increases resolution.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Lenard M. Voortman, Sjoerd Stallinga, Remco H.M. Schoenmakers, Lucas J. van Vliet, Bernd Rieger,