| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10672534 | Ultramicroscopy | 2011 | 12 Pages |
Abstract
⺠A new simultaneous defocus and astigmatism correction method is proposed. ⺠The method does not depend on the image Fourier transform. ⺠The method does not require amorphous area of the sample. ⺠The method is tested numerically as well, as for the real-world application.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
M.E. Rudnaya, W. Van den Broek, R.M.P. Doornbos, R.M.M. Mattheij, J.M.L. Maubach,