| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10672541 | Ultramicroscopy | 2011 | 10 Pages |
Abstract
⺠Limiting factors for single dopant atom detection are explained. ⺠Practical guidelines how to determine the optimal microscope and specimen conditions to image a dopant atom are provided.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Anudha Mittal, K. Andre Mkhoyan,