| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10672542 | Ultramicroscopy | 2011 | 6 Pages |
Abstract
⺠We demonstrated spatially resolved diffractometry with high spatial resolution using STEM. ⺠Atomic columns are clearly observed in dark field images obtained using the excess Kikuchi band even in small solid-angle detection. ⺠Atomic-column contrasts in dark field images are shifted by changing the azimuthal scattering angle. ⺠It is interpretable on the basis of the impact parameter in Rutherford scattering.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Koji Kimoto, Kazuo Ishizuka,