| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10672544 | Ultramicroscopy | 2011 | 7 Pages |
Abstract
⺠We developed a method to directly compare the shape evolution of AFM tips. ⺠Nanoscale damage and wear of probe tips in tapping mode scans were characterized. ⺠Surface modification by SAM to achieve hydrophobicity in as short as 2 min. ⺠Wear length and volume were used to quantify the wear of SAM coatings on AFM tips.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
Bernard Haochih Liu, Cheng-Hsien Chen,