| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10672548 | Ultramicroscopy | 2011 | 8 Pages |
Abstract
⺠When imaging cells, atomic force microscopy frequently encounters an artifact known as “side cliffs.” ⺠Using carbon nanotube (CNT) modified probes, this artifact can be completely eliminated. ⺠The origin and mechanism of elimination of this artifact are also discussed.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
J.E. Koehne, R.M. Stevens, T. Zink, Z. Deng, H. Chen, I.C. Weng, F.T. Liu, G.Y. Liu,