| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10672550 | Ultramicroscopy | 2011 | 8 Pages |
Abstract
⺠A double tilt-rotate specimen holder for diffraction contrast imaging in electron tomography. ⺠Precise alignment of a diffraction condition for tilt-series acquisition of TEM/STEM images. ⺠Complete visualization of 3D dislocation arrangements by dual-axis STEM tomography.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
S. Hata, H. Miyazaki, S. Miyazaki, M. Mitsuhara, M. Tanaka, K. Kaneko, K. Higashida, K. Ikeda, H. Nakashima, S. Matsumura, J.S. Barnard, J.H. Sharp, P.A. Midgley,