| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10672562 | Ultramicroscopy | 2011 | 6 Pages |
Abstract
⺠Different inelastic imaging methods are compared for electron tomography. ⺠Thickness map and plasmon map tomography reconstruct the morphology well.⺠A roadmap towards the selection of a specific TEM technique for tomography is presented.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
B. Goris, S. Bals, W. Van den Broek, J. Verbeeck, G. Van Tendeloo,