| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10672569 | Ultramicroscopy | 2011 | 10 Pages |
Abstract
⺠Unified description of phase measurements in electron holography. ⺠Detailed description of dark-field electron holography for geometric phase measurements. ⺠Correction procedure for systematic errors due to thickness variations.
Related Topics
Physical Sciences and Engineering
Materials Science
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Authors
M.J. Hÿtch, F. Houdellier, F. Hüe, E. Snoeck,