| Article ID | Journal | Published Year | Pages | File Type | 
|---|---|---|---|---|
| 10672570 | Ultramicroscopy | 2011 | 5 Pages | 
Abstract
												⺠Highly oriented pyrolytic graphite surface is bombarded using a focused ion beam. ⺠Raman spectroscopy is used to propose a new protocol to test focused ion beam optics. ⺠Scattering diameter of the ions on HOPG surface is experimentally obtained. ⺠Optical limitations of the ion column in fast writing speed are discussed. ⺠Small level of modifications is considered for changing graphene conductive properties.
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											Authors
												B.S. Archanjo, I.O. Maciel, E.H. Martins Ferreira, S.B. Peripolli, J.C. Damasceno, C.A. Achete, A. Jorio, 
											