| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10672572 | Ultramicroscopy | 2011 | 8 Pages |
Abstract
⺠Local surface profile can be obtained from experimental exit waves. ⺠At large defocus exit waves from neighboring columns interfere. ⺠This makes a local interpretation more difficult. ⺠A useful rule of thumb for the maximal defocus is derived.
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Authors
A. Wang, F.R. Chen, S. Van Aert, D. Van Dyck,