Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
10672576 | Ultramicroscopy | 2011 | 6 Pages |
Abstract
⺠Fluctuation electron microscopy depends on the sample thickness and probe coherence. ⺠The thickness dependence agrees with models for small thicknesses. ⺠Zero-loss energy filtering increases the signal to background. ⺠All these factors must be controlled to obtain quantitatively reliable data.
Related Topics
Physical Sciences and Engineering
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Authors
Feng Yi, P.M. Voyles,