Article ID Journal Published Year Pages File Type
10672576 Ultramicroscopy 2011 6 Pages PDF
Abstract
► Fluctuation electron microscopy depends on the sample thickness and probe coherence. ► The thickness dependence agrees with models for small thicknesses. ► Zero-loss energy filtering increases the signal to background. ► All these factors must be controlled to obtain quantitatively reliable data.
Related Topics
Physical Sciences and Engineering Materials Science Nanotechnology
Authors
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