| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10672578 | Ultramicroscopy | 2011 | 7 Pages |
Abstract
⺠Driving schemes of a dynamic AFM are examined to achieve the highest scan speed. ⺠Q-control provides the highest scan speed with increased transient forces. ⺠Off-resonance tapping is preferable unless transient forces can be ignored. ⺠False error signal generation methods provide a slight improvement.
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Authors
M. Balantekin, F.L. DeÄertekin,