| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10672579 | Ultramicroscopy | 2011 | 10 Pages |
Abstract
⺠We present a novel analysis method utilising robust fitting to relate HR-EBSD measurements to lattice strains and rotations. ⺠We demonstrate this analysis method using both simulated EBSPs and experimental patterns from deformed copper. ⺠In the simulated EBSPs demonstration, we show that the analysis enables reliable measurement of lattice rotations from ±8° up to ±11°. ⺠With the deformed copper example, we reveal a structure containing cell block boundaries.
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
T.B. Britton, A.J. Wilkinson,