| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10672583 | Ultramicroscopy | 2011 | 10 Pages |
Abstract
⺠Three methods for measuring the spatial coherence in a TEM are compared. ⺠The methods use different electron-optical configurations, applicable to STEM and HRTEM. ⺠One of these methods, applicable to STEM, is presented here for the first time. ⺠The methods are demonstrated to access different contributions to the effective source.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Nanotechnology
Authors
C. Maunders, C. Dwyer, P.C. Tiemeijer, J. Etheridge,