| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 10672584 | Ultramicroscopy | 2011 | 8 Pages |
Abstract
⺠Image blur affects XPEEM imaging at high photon flux densities. ⺠Energy broadening effects are observed in energy-filtered XPEEM spectromicroscopy. ⺠Lateral and energy resolution degradation result from Boersch and Loeffler effects. ⺠Electron-electron interactions are strongest in the initial part of the optical path.
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Authors
Andrea Locatelli, Tevfik Onur MenteÅ, Miguel Ángel Niño, Ernst Bauer,